Skip to content
Home
Company
Career
Knowledge
Technology
Eddy Current
Four Point Probe
Barkhausen Noise
Measurements
Sheet Resistance
Metal Layer Thickness
Resistivity
Electrical Anisotropy
Emissivity
Weight and Grammage Measurement
Permeability
Permittivity
Residual Moisture
Hot Metal Temperature Measurement
Displacement Measurement
Applications
Semiconductor
Wafer Characterization
Thin Film Characterization
Boule and Ingot Characterization
WLP/PLP
Energy Devices
Battery Cells and Stacks
Fuel Cell Components
H2 and CNG Storage
Display
Touch Panel
Front Panel
Glass
Architectural Glass
Automotive Glass
Smart Glass
Precision Optics
Photovoltaic
Crystalline Photovoltaic
Thin Film Photovoltaic
Carbon Fiber
Carbon Fiber Application
Packaging
Packaging Material Monitoring
Heating, Shielding, Printing
Printed Electronics
Positive Temperature Coefficient Heater (PTC)
Electromagnetic Shielding
Processes
CMP Process Monitoring and Endpoint Detection
Thickness Measurement for Feed Forward Etch Process Control
Calculator Tools
Sheet Resistance Calculator
Penetration Depth Calculator
Contact
Home
Company
Career
Knowledge
Technology
Eddy Current
Four Point Probe
Barkhausen Noise
Measurements
Sheet Resistance
Metal Layer Thickness
Resistivity
Electrical Anisotropy
Emissivity
Weight and Grammage Measurement
Permeability
Permittivity
Residual Moisture
Hot Metal Temperature Measurement
Displacement Measurement
Applications
Semiconductor
Wafer Characterization
Thin Film Characterization
Boule and Ingot Characterization
WLP/PLP
Energy Devices
Battery Cells and Stacks
Fuel Cell Components
H2 and CNG Storage
Display
Touch Panel
Front Panel
Glass
Architectural Glass
Automotive Glass
Smart Glass
Precision Optics
Photovoltaic
Crystalline Photovoltaic
Thin Film Photovoltaic
Carbon Fiber
Carbon Fiber Application
Packaging
Packaging Material Monitoring
Heating, Shielding, Printing
Printed Electronics
Positive Temperature Coefficient Heater (PTC)
Electromagnetic Shielding
Processes
CMP Process Monitoring and Endpoint Detection
Thickness Measurement for Feed Forward Etch Process Control
Calculator Tools
Sheet Resistance Calculator
Penetration Depth Calculator
Contact
Search
Our Technology
Products
Product Filter
Single Point
Handheld Device
EddyCus® Portable
EddyCus® Portable PS
Benchtop
EddyCus® lab 2020 TM
EddyCus® lab 2020 RMB for Pucks and Boules
EddyCus® lab 2020 RMB for Slurry and Paste
Imaging
Semi-automated
EddyCus® map 2530 TM for Wafer and Metallizations
EddyCus® map 2530 RMB for Pucks
EddyCus® map 2530 RMB for Wafer and Metallizations
EddyCus® map 2530 RMT for Boules
EddyCus® map 2530 RMT for Flat and Curved Samples
Fully-automated
EddyCus® ResMapper
Mapping Integration Kit
EddyCus® map IK
Inline
Sensor Overview
Inline for R2R, S2S and Wafer 2 Wafer
EddyCus® inline
EddyCus® inline Sensorline
Inline for Cables, Wires and Tubes
EddyCus® inline RS
Inline for Slurrys and Pastes
EddyCus® inline RS for Pastes and Slurries
Vacuum Cluster Tools
Near Process Solutions
EddyCus® inline ICM
EddyCus® inline MCM
EddyCus® inline SLIM
Robot Integration Kit
Accessories
Software
EddyCus® Studio
EddyEVA
EC inline Software
Software Development Kit (SDK)
Measurement Processors
Reference Sample Sets
Services
Measurement Service
Products by Parameters
Sheet Resistance
Metal Layer Thickness
Resistivity
Electrical Anisotropy
Emissivity
Areal Weight
Defect and Geometry
Electrical Properties and Wafer Dimensions
Industries
Our Technology
Products
Product Filter
Single Point
Handheld Device
EddyCus® Portable
EddyCus® Portable PS
Benchtop
EddyCus® lab 2020 TM
EddyCus® lab 2020 RMB for Pucks and Boules
EddyCus® lab 2020 RMB for Slurry and Paste
Imaging
Semi-automated
EddyCus® map 2530 TM for Wafer and Metallizations
EddyCus® map 2530 RMB for Pucks
EddyCus® map 2530 RMB for Wafer and Metallizations
EddyCus® map 2530 RMT for Boules
EddyCus® map 2530 RMT for Flat and Curved Samples
Fully-automated
EddyCus® ResMapper
Mapping Integration Kit
EddyCus® map IK
Inline
Sensor Overview
Inline for R2R, S2S and Wafer 2 Wafer
EddyCus® inline
EddyCus® inline Sensorline
Inline for Cables, Wires and Tubes
EddyCus® inline RS
Inline for Slurrys and Pastes
EddyCus® inline RS for Pastes and Slurries
Vacuum Cluster Tools
Near Process Solutions
EddyCus® inline ICM
EddyCus® inline MCM
EddyCus® inline SLIM
Robot Integration Kit
Accessories
Software
EddyCus® Studio
EddyEVA
EC inline Software
Software Development Kit (SDK)
Measurement Processors
Reference Sample Sets
Services
Measurement Service
Products by Parameters
Sheet Resistance
Metal Layer Thickness
Resistivity
Electrical Anisotropy
Emissivity
Areal Weight
Defect and Geometry
Electrical Properties and Wafer Dimensions
Industries
Home
Career
Contact
Products
Product Filter
Single Point
Handheld Device
EddyCus® Portable
EddyCus® Portable PS
Benchtop
EddyCus® lab 2020 TM
EddyCus® lab 2020 RMB for Pucks and Boules
EddyCus® lab 2020 RMB for Slurry and Paste
Imaging
Semi-Automated
EddyCus® map 2530 TM for Wafers and Metallizations
EddyCus® map 2530 RMB for Pucks
EddyCus® map 2530 RMB for Wafer and Metallizations
EddyCus® map 2530 RMT for Boules
EddyCus® map 2530 RMT for Flat and Curved Samples
Fully-Automated
EddyCus® ResMapper
Mapping Integration Kit
EddyCus® map IK
Inline
Sensor Overview
EddyCus® inline
EddyCus® inline RS
EddyCus® inline RS for Pastes and Slurries
EddyCus® inline SLIM
EddyCus® inline ICM
EddyCus® inline MCM
EddyCus® inline Sensorline
Near Process Measurement
Company
Knowledge
Technology
Eddy Current
Four Point Probe Measurement
Barkhausen Noise
Measurements
Sheet Resistance
Metal Layer Thickness Measurement
Resistivity Measurement
Electrical Anisotropy Measurement
Emissivity Measurement
Weight and Grammage Measurement
Permeability
Permittivity
Residual Moisture
Hot Metal Temperature Measurement
Displacement Measurement
Applications
Semiconductor
Wafer Characterization
Thin Film Characterization
Boule and Ingot Characterization
WLP/PLP
Energy Devices
Battery Cells and Stacks
Fuel Cell Components
H2 and CNG Storage
Display
Touch Panel
Front Panel
Glass
Architectural Glass
Automotive Glass
Smart Glass
Precision Optics
Photovoltaic
Crystalline Photovoltaic
Thin Film Photovoltaic
Packaging Material Monitoring
Carbon Fiber Application
Heating, Shielding, Printing
Printed Electronics
Positive Temperature Coefficient Heater (PTC)
Electromagnetic Shielding
Processes
CMP Process Monitoring and Endpoint Detection
Thickness Measurement for Feed Forward Etch Process Control
Calculator Tools
Sheet Resistance Calculator
Penetration Depth Calculator
Home
Career
Contact
Products
Product Filter
Single Point
Handheld Device
EddyCus® Portable
EddyCus® Portable PS
Benchtop
EddyCus® lab 2020 TM
EddyCus® lab 2020 RMB for Pucks and Boules
EddyCus® lab 2020 RMB for Slurry and Paste
Imaging
Semi-Automated
EddyCus® map 2530 TM for Wafers and Metallizations
EddyCus® map 2530 RMB for Pucks
EddyCus® map 2530 RMB for Wafer and Metallizations
EddyCus® map 2530 RMT for Boules
EddyCus® map 2530 RMT for Flat and Curved Samples
Fully-Automated
EddyCus® ResMapper
Mapping Integration Kit
EddyCus® map IK
Inline
Sensor Overview
EddyCus® inline
EddyCus® inline RS
EddyCus® inline RS for Pastes and Slurries
EddyCus® inline SLIM
EddyCus® inline ICM
EddyCus® inline MCM
EddyCus® inline Sensorline
Near Process Measurement
Company
Knowledge
Technology
Eddy Current
Four Point Probe Measurement
Barkhausen Noise
Measurements
Sheet Resistance
Metal Layer Thickness Measurement
Resistivity Measurement
Electrical Anisotropy Measurement
Emissivity Measurement
Weight and Grammage Measurement
Permeability
Permittivity
Residual Moisture
Hot Metal Temperature Measurement
Displacement Measurement
Applications
Semiconductor
Wafer Characterization
Thin Film Characterization
Boule and Ingot Characterization
WLP/PLP
Energy Devices
Battery Cells and Stacks
Fuel Cell Components
H2 and CNG Storage
Display
Touch Panel
Front Panel
Glass
Architectural Glass
Automotive Glass
Smart Glass
Precision Optics
Photovoltaic
Crystalline Photovoltaic
Thin Film Photovoltaic
Packaging Material Monitoring
Carbon Fiber Application
Heating, Shielding, Printing
Printed Electronics
Positive Temperature Coefficient Heater (PTC)
Electromagnetic Shielding
Processes
CMP Process Monitoring and Endpoint Detection
Thickness Measurement for Feed Forward Etch Process Control
Calculator Tools
Sheet Resistance Calculator
Penetration Depth Calculator
Search
Product Selection
Choosing the right measurement instrument.
Materials and Substrates
Band
Boule
Fiber
Foil
Ingot
Liquids
Metallization
Panel
Paste and Slurry
Plate
Powder
Puck
Rod
Tape
Textile
Tube
Wafer
Wide Band Gap
Wire
Measurement Types
2D Imaging
Handheld Device
Module Integration Kit
Sensor Integration Kit
Single Point
Parameters
Areal Weight
Bow
Defect and Geometry
Electrical Anisotropy
Emissivity
Metal Layer Thickness
Permittivity
Resistivity
Sheet Resistance
TTV
Reset Filter
EddyCus® Portable
EddyCus® Portable PS
Contact Us
Do you need help with product selection?
