EddyCus® map 2530 for Boules, Pucks and Wafers –
For High Quality Resistivity Mappings

The EddyCus® map 2530 RMT is a bench top scanner particularly suitable for research and technology labs. It is fully functional to measure especially high samples with non-flat surfaces like boules but also for pucks and wafers. It's a compact device, which can measure samples up to 200 mm (8 inch).

Benefits

  • High resolution images with over 30 000 measurement points within 4 minutes for best defect detection
  • Up to 100 mm height samples with a weight up to 10 kg 
  • Measurement up to the edge of the sample
  • Various analyzing options such as line profiles or histogram
  • Various sensor options to adjust the device optimal to your measurement task
  • Tension Frame allowes to adapt the sensor z-position to follow the contour of the samples surface

DISCUSS YOUR MEASUREMENT TASK

Fully automated imaging device with wafer mapping on web interface
Front view of the EddyCus® ResMapper – fully automated wafer mapping device with automated wafer handling system
Side view of the EddyCus® ResMapper – fully automated wafer mapping device with automated wafer handling system
Web interface showing a wafer mapping with line profiles scanned by the EddyCus® ResMapper – fully automated wafer imaging system

 


 

Measuring up to the Edge

Due to the small spot size of up to only 1 mm of the SURAGUS Sensor XS the EddyCus® map 2530 RMT has a extreme good spatial resolution. Because of that the sensor can measure up to the edge of the sample. That helps to record true measurement values instead of using an extrapolating algorythm to generate an complete image of the sample.

 


 

Curved and High Samples like Boules and Pucks

The puck and boule imaging device can measure samples with heights of up to 100 mm and a maximum boule curvature of 10 mm. It can also scan thin samples such as wafers. The device supports sample weights of up to 10 kg, which corresponds to a SiC puck measuring 200 mm in diameter and 100 mm in height. If you need to measure heavier samples, please contact us for more information.

Demonstrate the feasibility of eddy current technology in the case of carbon fiber mapping through a demo measurement

 


 

Eddy current measurement solutions are suitable for applications along the whole production process

High Resolution Mappings

The resolution of a scan depends on the measurement pitch choosen in the recipe and the size of the sample. A boule, puck or wafer with a diameter of 200 mm can have between over 30,000 measurement points (1 mm pitch) to around 300 measurement points (10 mm pitch). The difference in scanning speed is factor 10. The sweet spot between a high resolution and a high speed is the 2.5 mm pitch. Scans with 2.5 mm pitch have around 5,000 real measurement points on a 200 mm boule, puck or wafer.

Due to the high resolution all information remain intact. No interpolation between the measurement points will generate additional information. Therefore a high resolution is crucial for the detection of small defects or imperfections.

To ensure the best possible scanning results, we offer a broad range of sensor types, each with its own strengths and limitations. We carefully analyze each measurement task to determine which sensor is best suited, guaranteeing optimal performance for your specific needs.

 


 

For Various Sizes of Boules, Pucks and Wafers

For optimal results, it is crucial to position the samples precisely at the center. The inlays are available for samples of various diameters, up to 205 mm. They simplify and accelerate the positioning process, eliminating a potential source of error and ensuring more reliable results.

 


 

Easy to Use Software With Various Analyzing Options

The EddyCus® map 2530 RMT for boules, pucks and wafers has an easy to use software. After you laid your sample central on the measurement field you

  1. Choose your recipe
  2. Press on "Start"
  3. Watch the software creating the map while scan process proceeds

After the scan is finished you can start the analyzing process. You will be able to

  • Draw line profiles
    • predefined line profiles and
    • free drawed line profiles
  • Draw specific areas of interest
    • Rectangle
    • Circle
    • Pen to draw free area
  • Select a histogram

 


 

For more information please watch our data sheet or contact us by email.

Data Sheet for EddyCus® map 2530 RMT

Measurement technology High frequency eddy current sensor
Substrates Boules, pucks, wafers
Max. scanning area 8 inch / 205 mm x 205 mm x 100 mm
Edge effect correction / exclusion 2 – 10 mm (depending on size, range, setup and requirements)
Max. sample thickness / sensor gap 100 mm
Resistivity range 0.1 – 100 mOhm·cm (lower and higher on request)
Conductivity range 0.01 – 65 MS/m
Pitch 0.1 – 10 mm
Spot size (coil size)
Penetration depth (frequency)
1 – 9 mm (depending on coil size)
1 – 10 mm (depending on frequency)
Speed 150 mm per second (time 1 to 30 minutes)
Device dimensions (w/h/d) / weight 31.5” x 19.1” x 33.5” / 785 mm x 486 mm x 850 mm / 90 kg
Further available features Sheet resistance imaging, metal layer thickness imaging,
advanced impedance spectroscopy using EddyEVA

 


 

Alternative Solutions From SURAGUS

If you are interested in other solutions you can look at our EddyCus® portable PS or EddyCus® map 2530 RMB.

Contact

For product requests contact us by using the

For a prompt and informative response, please describe your measurement task (material, sample dimensions, expected measurement range) and provide your phone number.

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