Measurement Solutions for Display Industry
触摸屏传感器
前面板
Single Point Solutions
- 晶圆
Mapping Solutions
- SiC-Wafer Resistivity Homogeneity
- Si-Wafer Resistivity Homogeneity
- GaN-Wafer Resistivity Homogeneity
- GaAs-Wafer Resistivity Homogeneity
- Wafer Metallization Thickness Homogeneity
- Wafer Metallization Sheet Resistance Homogeneity
- Puck Slicing Quality
- Boules Crack and Defect Detection