EddyCus® map 2530 RMT
Resistvity Mapping and Defect Identification for Boules and Pucks Fast, precise mapping with non-contact eddy current technology improves thin-film and substrate quality. The short distance to the sample boosts signal strength and allows for a smaller spot size, enabling measurements close to the edge. High resolution images with over 30 000 measurement points within 4 […]
EddyCus® map 2530 RMB for Wafer and Metallizations
Mapping of Wafers and Metallization Layers Improved thin-film and substrate quality is achieved through high-resolution mapping enabled by non-contact eddy current technology. The EddyCus® map 2530 RMB, with its minimal spot size, allows for precise measurements in close proximity to the sample edge. Non-contact Fast and precise measurement High resolution mapping of conductive thin films […]
EddyCus® map 2530 RMB
Resistvity Mapping and Defect Identification for Boules, Pucks, Ingots and Wafers Enhanced thin-film and substrate quality through fast, precise mapping using non-contact eddy current technology. Designed for bulk materials like SiC or Si pucks up to 5 kg and 200 mm in height, with additional capability to measure wafers. Non-contact Fast and precise measurement High resolution mapping […]
EddyCus® map 2530 TM
Non-contact Sheet Resistance and Metal Layer Thickness Mapping Device Improve thin-film and substrate quality with fast, precise, non-contact mapping. The device accurately measures sheet resistance and correlating parameters in wafers, foils, glass, and metallized layers. Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 300 x 300 […]
EddyCus® lab 2020 RMB
Multi-Purpose Single PointResistivity Tester Higher material and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Contact Us Request Demo Measurement Eddy Current Technology Download Data Sheet […]
EddyCus® lab 2020 TM
Non-contact Sheet Resistance and Metal Layer Thickness Measurement Device for Single Point Measurements Higher thin-film and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Contact Us […]
EddyCus® Portable PS
Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Easy operation via ergonomic pen sensor. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live […]
EddyCus® Portable
Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live measurement Digital data collection and data […]
