Packaging Material Monitoring
Packaging Materials Monitoring Food packaging industry is driven by high-througput process requirements. To ensure excellent quality standards R2R processes have to be monitored, for barrier layers such as: Single-layer Multi-layer Al2O3 SixOy SiO2 Si3N4 Testing Sheet resistance Conductivity Thickness Homogeneity Substrates Plastic Polymer Metal Foil Process S2S R2R Markets Food Pharmaceutical Industrial OPV E-paper OLED
Thin Film Photovoltaic
Thin Film Photovoltaic Thin film PV module manufacturer have to adress highest quality in contact and absorber layer deposition. These processes are mainly driven by physical vapour deposition (PVD) and heating cycles close to glass softening point. To ensure highest efficiency in solar module at lowest manufacturing cost following processes have to be monitored: Back […]
Crystalline Photovoltaic
Crystalline Photovoltaic Different high effiency wafer based cell technologies are available in high volume manufacturing. Manufacturing costs are crucial for cells and modules. For achieving highest efficiency at lowest manfacturing cost, the following deposition processes have to be monitored: Metal grid Electrodes Buffer or seed layer Tunnel oxide Passivation layer Testing Sheet resistance Conductivity Thickness […]
Thin Film Characterization
Thin Film Characterization by Eddy Current Testing Technology Functional thin films on glass, foil and wafer are crucial to many applications and industries. Modern coatings are adapted to meet the growing demand and requirements such as: More efficient layer stacks depending on their functionality (e.g. higher transparency with low resistivity; better emissivity) Increasing of layer […]
WLP/PLP
Advanced Packaging Wafer and Panel Level Packaging (WLP, PLP) With International Technology Roadmap for Semiconductors (ITRS) retiring and International Roadmap for Devices and Systems (IRDS) taking over charge to roadmap the present and future technologies for the next 15 years, there is greater focus to look far more than Beyond CMOS. The introduction of Hetergenous […]
Boule and Ingot Characterization
Boule and Ingot Characterization Boule, crystal or ingot growth is crucial for excellent semiconductor applications, e.g. in light to defects, dislocations and grain boundaries. Beside state of the art processes such as Czochralski method, there are alternative technologies for crystal growth, e.g. from gaseous or liquid phase. To maintain and increase cost-efficiency high frequency eddy […]
Wafer Characterization
Wafer Characterization In seminconductor industry metal or metal oxide layers are applied for achieving electrical, mechanical, chemical, optical and a plethora of other characterisitcs. Properties such as sheet resistance, conductance, permeability or defectoscopy can be characterized by high frequency eddy current. Standard processes are vacuum processes such as evaporation, sputtering or atomic layer deposition (ALD) […]
Metal Layer Thickness Measurement
Information on Metal Layer Thickness and Metal Layer Thickness Measurements Content Overview Table of Contents Metal Layer Thickness Measurement by Eddy Current Testing Eddy current thickness gauges are applied across many industries measuring film thicknesses from a few nanometers to hundreds of micrometers or even millimeters. The underlying principle relies on the induction of eddy […]
Resistivity Measurement
Everything About Resistivity Measurement Content Overview Table of Contents Resistivity Measurement by Eddy Current Sensors Eddy current gauges and sensors are commonly applied for conductivity and resistivity measurement across many industries. Most systems operate in contact but there are also non-contact options available. The eddy current method is used for various reasons of which some […]
Electrical Anisotropy Measurement
Elektrische Anisotropy Measurement Content Overview Table of Contents Electrical Anisotropy Measurement by Eddy Current The measurement of electrical anisotropy by eddy current anisotropy sensors allows the precise measurement the anisotropy strength and anisotropy direction without sample preparation or even contacting the test object. The key of this innovation is the induction of directed eddy currents […]
