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      • Permeability
      • Permittivity
      • Residual Moisture
    • Applications
      • Semiconductor
        • Wafer Characterization
        • Thin Film Characterization
        • Boule and Ingot Characterization
        • WLP/PLP
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        • H2 and CNG Storage
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    • Imaging
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        • EddyCus® map 2530 TM for Wafer and Metallizations
        • EddyCus® map 2530 RMB for Pucks
        • EddyCus® map 2530 RMB for Wafer and Metallizations
        • EddyCus® map 2530 RMT for Boules
        • EddyCus® map 2530 RMT for Flat and Curved Samples
      • Fully-automated
        • EddyCus® ResMapper
    • Inline
      • Sensor Overview
      • Inline for R2R, S2S and Wafer 2 Wafer
        • EddyCus® inline
        • EddyCus® inline Sensorline
      • Inline for Cables, Wires and Tubes
        • EddyCus® inline RS
      • Inline for Slurrys and Pastes
        • EddyCus® inline RS
      • Vacuum Cluster Tools
        • Near Process Solutions
        • EddyCus® inline ICM
        • EddyCus® inline MCM
      • Robot Integration Kit
    • Accessories
      • Software
        • EddyCus® Studio
        • EddyEVA
        • EC inline Software
        • Software Development Kit (SDK)
        • Measurement Processors
      • Reference Sample Sets
    • Services
      • Measurement Service
  • Parameters
    • Sheet resistance calculator
    • Sheet Resistance
    • Metal Layer Thickness
    • Resistivity
    • Electrical Anisotropy
    • Emissivity
    • Areal Weight
    • Defect and Geometry
    • Electrical Properties and Wafer Dimensions
  • Applications
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      • Handheld Device
        • EddyCus® Portable
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        • EddyCus® lab 2020 TM
        • EddyCus® lab 2020 RMB
    • Imaging
      • Semi-Automated
        • EddyCus® map 2530 TM for Wafers and Metallizations
        • EddyCus® map 2530 RMB for Pucks
        • EddyCus® map 2530 RMB for Wafer and Metallizations
        • EddyCus® map 2530 RMT for Boules
        • EddyCus® map 2530 RMT for Flat and Curved Samples
      • Fully-Automated
        • EddyCus® ResMapper
    • Inline
      • Sensor Overview
      • EddyCus® inline
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    • Near Process Measurement
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      • Eddy Current
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    • Measurements
      • Sheet Resistance
      • Metal Layer Thickness Measurement
      • Resistivity Measurement
      • Electrical Anisotropy Measurement
      • Emissivity Measurement
      • Weight and Grammage Measurement
      • Permeability
      • Permittivity
      • Residual Moisture
    • Applications
      • Semiconductor
        • Wafer Characterization
        • Thin Film Characterization
        • Boule and Ingot Characterization
        • WLP/PLP
      • Energy Devices
        • Battery Cells and Stacks
        • Fuel Cell Components
        • H2 and CNG Storage
      • Display
        • Touch Panel
        • Front Panel
      • Glass
        • Architectural Glass
        • Automotive Glass
        • Smart Glass
        • Precision Optics
      • Photovoltaic
        • Crystalline Photovoltaic
        • Thin Film Photovoltaic
      • Packaging Material Monitoring
      • Carbon Fiber Application
      • Heating, Shielding, Printing
        • Printed Electronics
        • Positive Temperature Coefficient Heater (PTC)
        • Electromagnetic Shielding
    • Calculator Tools
      • Sheet resistance calculator
      • Penetration Depth Calculator
  • Home
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    • Single Point
      • Handheld Device
        • EddyCus® Portable
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      • Benchtop
        • EddyCus® lab 2020 TM
        • EddyCus® lab 2020 RMB
    • Imaging
      • Semi-Automated
        • EddyCus® map 2530 TM for Wafers and Metallizations
        • EddyCus® map 2530 RMB for Pucks
        • EddyCus® map 2530 RMB for Wafer and Metallizations
        • EddyCus® map 2530 RMT for Boules
        • EddyCus® map 2530 RMT for Flat and Curved Samples
      • Fully-Automated
        • EddyCus® ResMapper
    • Inline
      • Sensor Overview
      • EddyCus® inline
      • EddyCus® inline RS
      • EddyCus® inline ICM
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      • EddyCus® inline Sensorline
    • Near Process Measurement
  • Company
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    • Technology
      • Eddy Current
      • Four Point Probe Measurement
      • Barkhausenrauschen
    • Measurements
      • Sheet Resistance
      • Metal Layer Thickness Measurement
      • Resistivity Measurement
      • Electrical Anisotropy Measurement
      • Emissivity Measurement
      • Weight and Grammage Measurement
      • Permeability
      • Permittivity
      • Residual Moisture
    • Applications
      • Semiconductor
        • Wafer Characterization
        • Thin Film Characterization
        • Boule and Ingot Characterization
        • WLP/PLP
      • Energy Devices
        • Battery Cells and Stacks
        • Fuel Cell Components
        • H2 and CNG Storage
      • Display
        • Touch Panel
        • Front Panel
      • Glass
        • Architectural Glass
        • Automotive Glass
        • Smart Glass
        • Precision Optics
      • Photovoltaic
        • Crystalline Photovoltaic
        • Thin Film Photovoltaic
      • Packaging Material Monitoring
      • Carbon Fiber Application
      • Heating, Shielding, Printing
        • Printed Electronics
        • Positive Temperature Coefficient Heater (PTC)
        • Electromagnetic Shielding
    • Calculator Tools
      • Sheet resistance calculator
      • Penetration Depth Calculator

SEMICON Europa 2025

Date: 18 – 21. Nov 2025
Place: Munich

Booth: C1 570

SEMICON India 2025

Date: 02 – 04. Sept 2025
Place: New Delhi

Booth: 1424

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