Handheld Device For Measuring Conductive Layers Or Substrates
Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity
Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Easy operation via ergonomic pen sensor.
- Small and portable measurement device
- Measurement of hidden layers
- Manual measurement
- Instant live measurement
- Digital data collection and data transmission via Bluetooth
- Characterization of hidden and encapsulated conductive layers
Introduction
The EddyCus® portable 1010 PS is a handy and portable measurement device for fast contact measurement of large glasses, foils, pucks and boules in production or in the field, for example for quick quality checks after manufacturing or as incoming good inspection. The handheld device allows the measurement even of hidden and encapsulated layers. It is an easy-to-use device that is controlled via a touch display
Typical applications of the device are:
- Manual quality control, incoming inspection, inspection of outgoing goods
- Contact characterization of conductive materials
- Single point measurement in contact (measurement with constant distance on request)
- Planar surfaces from
- 150 x 150 mm for thin films (setups for 50 x 50 mm and 100 x 100 mm on request) and
- 50 x 50 x 10 mm for bulk materials
Features and Benefits
Wireless Data Transfer
Up to 9h Operation Time
Touch Display
Digital Data Collection
Quick Check with
Instant Values
< 3 % Accuracy
< 1.5 % Repeatability
Large Substrates Measureable
> 150 mm x 150 mm
Digital Data
Management
Capabilities of the Device
The EddyCus® portable PS is capable of measuring multiple parameters. Sheet resistance correlates with metal layer thickness, emissivity, and resistivity. As long as the material properties are well known, all of these parameters can be measured with high precision.
- Sheet resistance
- Metal layer thickness
- Resistivity
- Conductivity
- Emissivity
Software and Device Control
The intuitive software interface allows users to quickly select a predefined recipe and initiate a measurement with a single click. Results are displayed in under one second.
- User-friendly user interface
- Touch display
- Digital data tracking
- Long battery lifetime (approximately 9 h in continuous operation)
- Instant measurement of sheet resistance and correlated properties such layer thickness and emissivity and data aggregation
- Bluetooth interface
Video of the EddyCus® portable PS
The video gives you an impression of how to use the Portable. Which materials can be analysed and how the device works in general.
Data Table for EddyCus® portable PS
| Measurement technology | Eddy current pen sensor |
| Measurement mode | Realtime at constant distance / contact |
| Substrates | Ingots, pucks, boules, glass, foils, etc. |
| Substrate sizes | Flat samples > Absolut minimum on sample size is 10 x 10 mm² Curved samples with a curvature from 50 mm |
| Measurement spot / high sensitivity zone | 40 mm diameter (1.6 inch) |
| Power | Lithium ion battery up to 20 h |
| Emissivity range | 0.003 – 0.5 |
| Sheet resistance range | Additional feature, 0.3 – 100 Ohm/sq |
| Thickness measurement of thin films (e.g. silver) | Additional feature, 5 nm – 50 nm (in accordance with sheet resistance) |
| Accuracy (for planar solid surfaces, e.g. glass) | < 3% |
| Display | 2.8 inch colored touch screen |
| Device dimensions (w/h/d) @ weight | 3.5” x 7” x 1.9” / 87 mm x 178 mm x 48 mm @ 340g |
| Interfaces | Bluetooth (optional) |
Measurement Capabilities – EddyCus® portable PS
| Sheet Resistance Measurement | ||||||||||||||||||||||||||
| Sheet resistance range |
Low: 0.001 – 10 Ohm/sq Std: 0.3 – 100 Ohm/sq |
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| Accuracy | Better 3 % | |||||||||||||||||||||||||
| Repeatability | Better 1.5 % | |||||||||||||||||||||||||
| Emissivity Measurement | ||||||||||||||||||||||||||
| Emissivity range | 0.003 – 0.1 | |||||||||||||||||||||||||
| Metal Layer Thickness Measurement | ||||||||||||||||||||||||||
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| Resistivity Measurement | ||||||||||||||||||||||||||
| Resistivity range |
Low: 0.0025 – 0.015 mOhm·cm Std: 1 – 300 mOhm·cm |
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| Accuracy | Better 3 % | |||||||||||||||||||||||||
| Repeatability | Better 1.5 % | |||||||||||||||||||||||||
| Conductivity Measurement | ||||||||||||||||||||||||||
| Conductivity range for metals and alloys | 0.01 – 65 MS/m | |||||||||||||||||||||||||
| Conductivity range for SiC | 0.003 – 0.03 MS/m | |||||||||||||||||||||||||
| Conductivity range for Si, GaN, GaAs | Upon request | |||||||||||||||||||||||||
