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EddyCus® inline Sensorline
Full-area Sheet Resistance and Layer Thickness Measurement Solution for Process Control Higher Thin-film and substrate quality through fast and precise multi sensor Inline Measurement based on non-contact eddy current technology. Non-contact real time measurement High measurement speed up to 50 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring […]
EddyCus® inline
Non-Contact Process and Quality Monitoringfor Conductive Materials and Coatings highly flexible inline measurement solutions, seamlessly adaptable to your specific production process. Non-contact real time measurement High measurement speed up to 1,000 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring lanes per system Process control at atmosphere or in […]
EddyCus® map 2530 RMT – Mixed Solutions
Multi Application Imaging Device Higher Thin-film and substrate quality through fast and precise mapping devices based on non-contact eddy current technology. High resolution images with over 30 000 measurement points within 4 minutes for best defect detection Measurement up to the edge of the sample Various analyzing options such as line profiles or histogram Various […]
EddyCus® map 2530 RMB
Resistvity Mapping and Defect Identification for Boules, Pucks, Ingots and Wafers Enhanced thin-film and substrate quality through fast, precise mapping using non-contact eddy current technology. Designed for bulk materials like SiC or Si pucks up to 5 kg and 200 mm in height, with additional capability to measure wafers. Non-contact Fast and precise measurement High resolution mapping […]
EddyCus® lab 2020 RMB
Multi-Purpose Single PointResistivity Tester Higher material and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Contact Us Request Demo Measurement Eddy Current Technology Download Data Sheet […]
EddyCus® lab 2020 TM
Non-contact Sheet Resistance and Metal Layer Thickness Measurement Device for Single Point Measurements Higher thin-film and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Contact Us […]
EddyCus® Portable PS
Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Easy operation via ergonomic pen sensor. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live […]
EddyCus® Portable
Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live measurement Digital data collection and data […]
