EddyCus® map IK
Non-contact Eddy Current Mapping Integration Kit for Sheet Resistance, Film Thickness and Resistivity Imaging Modular Sensor mapping integration kit to generate metal thinfilm thickness, sheet resistance or resistivity images of wafers, pucks and boules High resolution images with up to 70,000 measurement points (300 mm @ 1 mm pitch) Up to 40 wafers per hour […]
EddyCus® inline RS for Pastes and Slurries
Conductive Slurry and Paste Testing Solutions for Process Control Higher process and material quality through fast and precise Inline Measurement based on non-contact eddy current technology. Quality assurance Process control Yield improvement Customer trust by documented spool / roll report Send a Request Request Demo Measurement Eddy Current Technology Download Data Sheet Contact Page Call […]
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EddyCus® inline RS
Conductive Cable, Wire and Tube Testing Solutions for Process Control Higher Thin-film and substrate quality through fast and precise Inline Measurement based on non-contact eddy current technology. Quality assurance Process control Yield improvement Customer trust by documented spool / roll report Send a Request Request Demo Measurement Eddy Current Technology Download Data Sheet Contact Page […]
EddyCus® inline Sensorline
Full-area Sheet Resistance and Layer Thickness Measurement Solution for Process Control Higher Thin-film and substrate quality through fast and precise multi sensor Inline Measurement based on non-contact eddy current technology. Non-contact real time measurement High measurement speed up to 50 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring […]
EddyCus® inline
Non-Contact Process and Quality Monitoringfor Conductive Materials and Coatings highly flexible inline measurement solutions, seamlessly adaptable to your specific production process. Non-contact real time measurement High measurement speed up to 1,000 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring lanes per system Process control at atmosphere or in […]