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Measurement Service
Measurement-as-a-Service For companies that do not operate continuous quality control and only measure a few times a year. Non-contact measurement No space for a measurement device required No budget required for a self-owned measurement device No training period for a measurement expert required Contact Us Introduction You benefit from the experience of our employees who […]
EddyCus® inline Sensorline
Full-area Sheet Resistance and Layer Thickness Measurement Solution for Process Control Higher Thin-film and substrate quality through fast and precise multi sensor Inline Measurement based on non-contact eddy current technology. Non-contact real time measurement High measurement speed up to 50 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring […]
EddyCus® inline
Non-Contact Process and Quality Monitoringfor Conductive Materials and Coatings highly flexible inline measurement solutions, seamlessly adaptable to your specific production process. Non-contact real time measurement High measurement speed up to 1,000 measurements/ sec. Fixed sensor installation or traversing sensor installation Integration of 1 – 99 monitoring lanes per system Process control at atmosphere or in […]
EddyCus® map 2530 TM
Non-contact Sheet Resistance and Metal Layer Thickness Mapping Device Improve thin-film and substrate quality with fast, precise, non-contact mapping. The device accurately measures sheet resistance and correlating parameters in wafers, foils, glass, and metallized layers. Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 300 x 300 […]
EddyCus® lab 2020 TM
Non-contact Sheet Resistance and Metal Layer Thickness Measurement Device for Single Point Measurements Higher thin-film and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Contact Us […]
