EddyCus® lab 2020 TM

Non-contact Sheet Resistance and Metal Layer Thickness Measurement Device for Single Point Measurements Higher thin-film and substrate quality through fast and precise laboratory devices based on non-contact eddy current technology. Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Send a […]

EddyCus® Portable PS

Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Easy operation via ergonomic pen sensor. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live […]

EddyCus® Portable

Handheld Device For Measuring Conductive Layers Or Substrates Parameters: Sheet Resistance · Metal Layer Thickness · Resistivity · Conductivity · Emissivity Non-destructive testing using eddy current technology – fast, accurate, and ready for on-site quality control. Small and portable measurement device Measurement of hidden layers Manual measurement Instant live measurement Digital data collection and data […]